$High Resolution X-Ray Diffractometry And Topography by D.K. Bowen at Abbey's Bookshop,$

High Resolution X-Ray Diffractometry And Topography

— —

D.K. Bowen Brian K. Tanner

High Resolution X-Ray Diffractometry And Topography

D.K. Bowen, Brian K. Tanner

$378

Hardback

Not in-store but you can order this
How long will it take?

Availability Information

We source books from suppliers in Australia and overseas. For books we don't currently have in stock, the time it takes to get them from our suppliers can vary widely - from a few days to a few months - so we check each book with each supplier to determine the expected time it will take to be supplied to us.

We then advise you accordingly. If the time taken to get any book is too long for you, you can let us know and we will cancel or adjust your order, and refund as required.

To find out the anticipated arrival time for specific items prior to ordering, please contact us by phone or email:

Phone +61 2 9264 3111, or 1800 4 BOOKS (1800 4 26657) if outside Sydney:
option 1 Abbey's Bookshop (Crime, History, Science, Kids & more) • info@abbeys.com.au
option 2 Language Book Centre (ESL & Foreign Languages) • language@abbeys.com.au
option 3 Galaxy Bookshop (Sci-fi, Fantasy, Romance, Graphic Novels) • sf@galaxybooks.com.au

QTY:

English

Taylor & Francis Ltd
05 February 1998

Maths for scientists; Light (optics); Crystallography; Maths for engineers; Materials science

The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal

materials by means of high-resolution x-ray diffraction and

topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.

By: D.K. Bowen, Brian K. Tanner
Imprint: Taylor & Francis Ltd
Country of Publication: United Kingdom
Dimensions: Height: 246mm, Width: 174mm, Spine: 15mm
Weight: 589g
ISBN: 9780850667585
ISBN 10: 0850667585
Pages: 264
Publication Date: 05 February 1998
Audience: Professional and scholarly , Undergraduate
Format: Hardback
Publisher's Status: Active

Introduction- diffraction studies of crystal perfection; high resolution X- ray diffraction techniques; analysis of expitaxial layers; X-ray scattering theory; simulation of X-ray diffraction rocking curves; analysis of thin films and multiple layers; triple axis X-ray diffractometry; single crystal X-ray topography; double crystal X-ray topography; synchrotron radiation topography.

Bowen, D.K.; Tanner, Brian K.