$High Resolution X-Ray Diffractometry And Topography by D.K. Bowen at Abbey's Bookshop,$

High Resolution X-Ray Diffractometry And Topography

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D.K. Bowen Brian K. Tanner

High Resolution X-Ray Diffractometry And Topography

D.K. Bowen, Brian K. Tanner

$126

Paperback

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English

CRC Press
10 October 2019

Light (optics); Materials science

The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.

By: D.K. Bowen, Brian K. Tanner
Imprint: CRC Press
Country of Publication: United Kingdom
Dimensions: Height: 246mm, Width: 174mm,
Weight: 485g
ISBN: 9780367400637
ISBN 10: 0367400634
Pages: 264
Publication Date: 10 October 2019
Audience: Professional and scholarly , Undergraduate
Format: Paperback
Publisher's Status: Active

Introduction- diffraction studies of crystal perfection; high resolution X- ray diffraction techniques; analysis of expitaxial layers; X-ray scattering theory; simulation of X-ray diffraction rocking curves; analysis of thin films and multiple layers; triple axis X-ray diffractometry; single crystal X-ray topography; double crystal X-ray topography; synchrotron radiation topography.

Bowen, D.K.; Tanner, Brian K.