Acoustic Scanning Probe Microscopy

Francesco Marinello, Daniele Passeri, Enrico Savio

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Hardback

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English

Springer-Verlag Berlin and Heidelberg GmbH & Co. K
04 October 2012

Microscopy

Series: NanoScience and Technology

Summary
Details

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.

Edited by: Francesco Marinello, Daniele Passeri, Enrico Savio
Imprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Country of Publication: Germany
Edition: 2013 ed.
Dimensions: Height: 235mm, Width: 155mm, Spine: 30mm
Weight: 8.985kg
ISBN: 9783642274930
ISBN 10: 3642274935
Series: NanoScience and Technology
Pages: 494
Publication Date: 04 October 2012
Audience: Professional and scholarly , Undergraduate
Format: Hardback
Publisher's Status: Active