Acoustic Scanning Probe Microscopy

Francesco Marinello, Daniele Passeri, Enrico Savio

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English

Springer-Verlag Berlin and Heidelberg GmbH & Co. K
09 November 2014

Microscopy

Series: NanoScience and Technology

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.

Edited by: Francesco Marinello, Daniele Passeri, Enrico Savio
Imprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Country of Publication: Germany
Edition: 2013 ed.
Dimensions: Height: 235mm, Width: 155mm, Spine: 27mm
Weight: 7.781kg
ISBN: 9783642430794
ISBN 10: 3642430791
Series: NanoScience and Technology
Pages: 494
Publication Date: 09 November 2014
Audience: Professional and scholarly , Undergraduate
Format: Paperback
Publisher's Status: Active

From the contents: Overview of acoustic techniques.- Contact dynamics modelling.- Cantilever dynamics: theoretical modeling.- Finite elements modelling.- AFAM calibration.- Enhanced sensitivity.- UAFM.- Holography calibration.- UFM.- Friction/lateral techniques.- Harmonix.- Scanning microdeformation microscopy (SMM).- Tip wear.- Comparison with other techniques.- Applications polymer.- Thin films.