Modeling Nanoscale Imaging in Electron Microscopy

Thomas Vogt, Wolfgang Dahmen, Peter Binev

$251.95 $201.58

Paperback

Not in-store but you can order this
How long will it take?

Availability Information

We source books from suppliers in Australia and overseas. For books we don't currently have in stock, the time it takes to get them from our suppliers can vary widely - from a few days to a few months - so we check each book with each supplier to determine the expected time it will take to be supplied to us.

We then advise you accordingly. If the time taken to get any book is too long for you, you can let us know and we will cancel or adjust your order, and refund as required.

To find out the anticipated arrival time for specific items prior to ordering, please contact us by phone or email:

Phone +61 2 9264 3111, or 1800 4 BOOKS (1800 4 26657) if outside Sydney:
option 1 Abbey's Bookshop (Crime, History, Science, Kids & more) • info@abbeys.com.au
option 2 Language Book Centre (ESL & Foreign Languages) • language@abbeys.com.au
option 3 Galaxy Bookshop (Sci-fi, Fantasy, Romance, Graphic Novels) • sf@galaxybooks.com.au

QTY:

English

Springer-Verlag New York Inc.
13 April 2014

Microscopy

Series: Nanostructure Science and Technology

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

Edited by: Thomas Vogt, Wolfgang Dahmen, Peter Binev
Imprint: Springer-Verlag New York Inc.
Country of Publication: United States
Edition: 2012 ed.
Dimensions: Height: 235mm, Width: 155mm, Spine: 13mm
Weight: 308g
ISBN: 9781489997289
ISBN 10: 1489997288
Series: Nanostructure Science and Technology
Pages: 182
Publication Date: 13 April 2014
Audience: College/higher education , Further / Higher Education
Format: Paperback
Publisher's Status: Active

Thomas Vogt is Director of the NanoCenter Educational Foundation and Distinguished Professor of Chemistry & Biochemistry at the University of South Carolina. Wolfgang Dahmen is a professor at RWTH Aachen. Peter G. Binev is a Professor of Mathematics at the University of South Carolina.

Reviews for Modeling Nanoscale Imaging in Electron Microscopy

From the reviews: In six chapters, the editors tackle the ambitious challenge of bridging the gap between high-level applied mathematics and experimental electron microscopy. They have met the challenge admirably. ... That work is also applicable to the new generation of x-ray free-electron lasers, which have similar prospective applications, and illustrates nicely the importance of applied mathematics in the physical sciences. Modeling Nanoscale Imaging in Electron Microscopy will be an important resource for graduate students and researchers in the area of high-resolution electron microscopy. (Les J. Allen, Physics Today, Vol. 65 (5), May, 2012)