This book offers a comprehensive and accessible introduction to atomic force microscopy (AFM) — a fundamental technique in nanoscience, nanotechnology, and materials characterization. While the basic operating principle of AFM is straightforward, the processes of data acquisition, quantitative analysis, and interpretation require deeper scientific understanding.
Designed for readers with a first-year university background in mathematics and physics, this text builds a strong foundation for mastering both the practical and theoretical aspects of AFM.
By:
Nancy A Burnham (Worcester Polytechnic Institute Usa & Eth Zurich Switzerland) Imprint: World Scientific Publishing Co Pte Ltd Country of Publication: Singapore ISBN:9789819824304 ISBN 10: 9819824303 Pages: 250 Publication Date:11 March 2026 Audience:
College/higher education
,
Professional and scholarly
,
Primary
,
Undergraduate
Format:Paperback Publisher's Status: Active