Advanced X-Ray Radiation Detection

: Medical Imaging and Industrial Applications

Krzysztof (Kris) Iniewski

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Hardback

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English

Springer Nature Switzerland AG
05 July 2022

Biomedical engineering; Circuits & components; Applied optics

This book offers readers an overview of some of the most recent advances in the field of technology for X-ray medical imaging. Coverage includes both technology and applications in SPECT, PET and CT, with an in-depth review of the research topics from leading specialists in the field. Coverage includes conversion of the X-ray signal into analogue/digital value, as well as a review of CMOS chips for X-ray image sensors. Emphasis is on high-Z materials like CdTe, CZT and GaAs, since they offer the best implementation possibilities for direct conversion X-ray detectors. The discussion includes material challenges, detector operation physics and technology and readout integrated circuits required to detect signals processes by high-Z sensors. Authors contrast these emerging technologies with more established ones based on scintillator materials. This book is an excellent reference for people already working in the field as well as for people wishing to enter it.

Edited by: Krzysztof (Kris) Iniewski
Imprint: Springer Nature Switzerland AG
Country of Publication: Switzerland
Edition: 1st ed. 2023
Dimensions: Height: 235mm, Width: 155mm,
Weight: 606g
ISBN: 9783030929886
ISBN 10: 3030929884
Pages: 281
Publication Date: 05 July 2022
Audience: Professional and scholarly , Undergraduate
Format: Hardback
Publisher's Status: Active

X-ray Detectors in Medical Imaging.- Modelling spectroscopic performance of pixelated semiconductor detectors through Monte-Carlo simulation.- Status of DEXA Instrumentation Using Direct and Indirect Detectors.- CZT Detectors for Nuclear Medicine.- Positron Emission Tomography (PET) Imaging Based on Sub-Millimeter Pixelated CdZnTe Detectors.- Medical Photon-Counting CT – Status and Clinical Applications Review.- Multi-material decomposition (m-MD) based spectral imaging in photon-counting CT.- X-ray Multispectral CT Imaging by Projection Sequences Blind Separation based on Basis-effect or Basis-material decomposition.- Direct Iterative Basis Image Reconstruction Based on MAP-EM Algorithm for Spectral CT.- Linearly Polarized X-ray Fluorescence Computed Tomography with a Photon Counting Detector.- Detector shift iteration method for improving spatial resolution and suppressing pixel value distortion in direct and indirect X-ray detectors.- A new method of estimating incident x-ray spectra with photon counting detectors using a limited number of energy bins with dedicated clinical x-ray imaging systems.

Krzysztof (Kris) Iniewski is managing R&D development activities at Redlen Technologies Inc., a detector company based in British Columbia, Canada. During his 15 years at Redlen he has managed development of highly integrated CZT detector products in medical imaging and security applications. Prior to Redlen Kris hold various management and academic positions at PMC-Sierra, University of Alberta, SFU, UBC and University of Toronto. Dr. Iniewski has published over 150+ research papers in international journals and conferences. He holds 20+ international patents granted in USA, Canada, France, Germany, and Japan. He wrote and edited several books for Wiley, Cambridge University Press, Mc-Graw Hill, CRC Press and Springer. He is a frequent invited speaker and has consulted for multiple organizations internationally.