$X-Ray Diffraction for Materials Research: From Fundamentals to Applications by Myeongkyu Lee (Point Pleasant, New Jersey, USA) at Abbey's Bookshop,$

X-Ray Diffraction for Materials Research: From Fundamentals to Applications

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Myeongkyu Lee (Point Pleasant, New Jersey, USA)

X-Ray Diffraction for Materials Research

From Fundamentals to Applications

Myeongkyu Lee (Point Pleasant, New Jersey, USA)

$252

Hardback

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English

Apple Academic Press Inc.
11 February 2016

Testing of materials

X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction.

The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also

• provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics

• covers the practical applications as well as the underlying principle of X-ray diffraction

• presents appropriate examples with answers to help readers understand the contents more easily

• includes thin film characterization by X-ray diffraction with relevant experimental techniques

• presents a huge number of elaborately drawn graphics to help illustrate the content

The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition.

Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis.

This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.

By: Myeongkyu Lee (Point Pleasant New Jersey USA)
Imprint: Apple Academic Press Inc.
Country of Publication: Canada
Dimensions: Height: 229mm, Width: 152mm, Spine: 23mm
Weight: 720g
ISBN: 9781771882989
ISBN 10: 1771882980
Pages: 302
Publication Date: 11 February 2016
Audience: College/higher education , Professional and scholarly , Primary , Undergraduate
Format: Hardback
Publisher's Status: Active

X-Rays and Crystal Geometry. Electromagnetic Waves and X-Rays. Geometry of Crystals. Interference and Diffraction. Theory of X-Ray Diffraction. Directions of X-Ray Diffraction. Intensities of X-Ray Diffraction. Applications of X-Ray Diffraction. Characterization of Thin Films by X-Ray Diffraction. Laue Method And Determination of Single Crystal Orientation. Powder Diffraction. Index.

Lee, Myeongkyu||

Reviews for X-Ray Diffraction for Materials Research: From Fundamentals to Applications

This book is a highly accessible introduction to XRD for materials research. It is written in concise and clear prose. The text creates a cohesive picture of XRD. After finishing this book, researchers will be able to understand the basics of many materials science and engineering research papers. . . . X-ray diffraction (XRD) is a powerful nondestructive characterization technique for determining the structure, phase, composition, and strain in materials. It is one of the most frequently employed methods for characterizing materials. This book distinguishes itself from other books on this topic by its simplified treatment and its coverage of thin-film analysis. It largely minimizes the mathematics and is profusely illustrated, making it a good entry point for learning the basic principles of XRD. The common thin-film structures (random polycrystalline, textured) and their relationships with the substrate (strain, in-plane rotation) are defined and explained. This makes it valuable to researchers who study thin-film deposition. The book includes example problems to reinforce the concepts covered, plus problems that can be assigned as homework. -J.H. Edgar, Kansas State University, USA, for MRS BULLETIN, February 2017