Memory, Microprocessor, and ASIC

Wai-Kai Chen (University of IIlinois, Chicago, USA)

$357

Hardback

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English

CRC Press Inc
26 March 2003

Power generation & distribution; Circuits & components; Microprocessors; Environmental science, engineering & technology

Series: Principles and Applications in Engineering

Timing, memory, power dissipation, testing, and

testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power consumption and recent developments in low-power memories. Reflecting the rapid development and importance of systems-on-a-chip (SOCs), an entire chapter is devoted to application-specific integrated circuits (ASICs). Design-related topics include microprocessor architectures, layout methods, design verification, testability concepts, and various CAD tools..

Edited by: Wai-Kai Chen (University of IIlinois Chicago USA)
Imprint: CRC Press Inc
Country of Publication: United States
Dimensions: Height: 254mm, Width: 178mm, Spine: 26mm
Weight: 1.830kg
ISBN: 9780849317378
ISBN 10: 0849317371
Series: Principles and Applications in Engineering
Pages: 384
Publication Date: 26 March 2003
Audience: Professional and scholarly , Professional and scholarly , Professional & Vocational , Undergraduate , Further / Higher Education
Format: Hardback
Publisher's Status: Active

System Timing. ROM/PROM/EPROM. SRAM. Embedded Memory. Flash Memories. Dynamic Random Access Memory. Low-Power Memory Circuits. Timing and Signal Integrity Analysis. Microprocessor Design Verification. Microprocessor Layout Method. Architecture. ASIC Design. Logic Synthesis for Field Programmable Gate Array (EPGA) Technology. Testability Concepts and DFT. ATPG and BIST. CAD Tools for BIST/DFT and Delay Faults.

Wai-Kai Chen