Thin films of conducting materials, such as metals, alloys and semiconductors are currently in use in many areas of science and technology, particularly in modern integrated circuit microelectronics that require high quality thin films for the manufacture of connection layers, resistors and ohmic contacts. These conducting films are also important for fundamental investigations in physics, radio-physics and physical chemistry. Physical Properties of Thin Metal Films provides a clear presentation of the complex physical properties particular to thin conducting films and includes the necessary theory, confirming experiments and applications. The volume will be an invaluable reference for graduates, engineers and scientists working in the electronics industry and fields of pure and applied science.
Edited by:
G.P. Zhigal'skii, Brian K. Jones Imprint: CRC Press Country of Publication: United Kingdom Dimensions:
Height: 229mm,
Width: 152mm,
Weight: 453g ISBN:9780367395131 ISBN 10: 0367395134 Pages: 232 Publication Date:26 September 2019 Audience:
Professional and scholarly
,
College/higher education
,
Undergraduate
,
Further / Higher Education
Format:Paperback Publisher's Status: Active
Conduction in Discontinuous Films. Size-effects in Thin Metal Films. Internal Mechanical Stresses and Voids in Thin Metal Films. Electrical Noise in Thin Films and Thin-Film Structures. Non-linear Conduction and Non-Equilibrium Noise in Thin Films. Degradation Mechanisms in Thin Metal Films.
G. P. Zhigal'skii, B. K. Jones
Reviews for The Physical Properties of Thin Metal Films
The authors present a good blend of applications and theory by including many graphs for specific materials along with generalized theory. - IEEE Electrical Insulation Magazine, Nov/Dec 2004, Vol. 20, No. 6