Speckle Metrology

R.S. Sirohi, Brian J. Thompson (University of Rochester, New York, USA)

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English

CRC Press Inc
20 May 1993

Light (optics); Engineering measurement & calibration; Applied optics

Series: Optical Science and Engineering

"This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry. Examing every important aspect of the field, ""Speckle Metrology"": surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems. With over 1500 literature citations, tables, figures and display equations, ""Speckle Metrology"" is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis."

By: R.S. Sirohi
Series edited by: Brian J. Thompson (University of Rochester New York USA)
Imprint: CRC Press Inc
Country of Publication: United States
Volume: 38
Dimensions: Height: 229mm, Width: 152mm, Spine: 31mm
Weight: 861g
ISBN: 9780824789329
ISBN 10: 0824789326
Series: Optical Science and Engineering
Pages: 572
Publication Date: 20 May 1993
Audience: Professional and scholarly , General/trade , Undergraduate
Format: Hardback
Publisher's Status: Active

R. S Sirohi (Author)

Reviews for Speckle Metrology

""". . .an important addition to this field. "" ---Optics & Photonics News "". . .a good book. . ..covers most of the important aspects of speckle metrology. "" ---Optical Engineering"