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Semiconductor Devices in Harsh Conditions by Kirsten Weide-Zaage (Leibniz University Hannover, Germany) at Abbey's Bookshop,
Semiconductor Devices in Harsh Conditions
— —
Kirsten Weide-Zaage (Leibniz University Hannover, Germany) Malgorzata Chrzanowska-Jeske (Portland State University, Oregon, USA)

Semiconductor Devices in Harsh Conditions

Kirsten Weide-Zaage (Leibniz University Hannover, Germany),  Malgorzata Chrzanowska-Jeske (Portland State University, Oregon, USA)

$110

Paperback

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English
CRC Press
30 September 2020
Semi-conductors & super-conductors
Series: Devices, Circuits, and Systems
This book introduces the reader to a number of challenges for the operation of electronic devices in various harsh environmental conditions. While some chapters focus on measuring and understanding the effects of these environments on electronic components, many also propose design solutions, whether in choice of material, innovative structures, or strategies for amelioration and repair. Many applications need electronics designed to operate in harsh environments. Readers will find, in this collection of topics, tools and ideas useful in their own pursuits and of interest to their intellectual curiosity.

With a focus on radiation, operating conditions, sensor systems, package, and system design, the book is divided into three parts. The first part deals with sensing devices designed for operating in the presence of radiation, commercials of the shelf (COTS) products for space computing, and influences of single event upset. The second covers system and package design for harsh operating conditions. The third presents devices for biomedical applications under moisture and temperature loads in the frame of sensor systems and operating conditions.
Edited by:   , , ,
Imprint:   CRC Press
Country of Publication:   United Kingdom
Dimensions:   Height: 234mm,  Width: 156mm, 
Weight:   471g
ISBN:   9780367656362
ISBN 10:   0367656361
Series:   Devices, Circuits, and Systems
Pages:   234
Publication Date:  
Audience:   College/higher education ,  A / AS level ,  Further / Higher Education
Format:   Paperback
Publisher's Status:   Active
Section I Radiation. Commercial Off-the-Shelf Components in Space Applications. Soft Errors in Digital Circuits Subjected to Natural Radiation: Characterisation, Modelling and Simulation Issues. Simulation of Single-Event Effects on Fully Depleted Siliconon-Insulator (FDSOI) CMOS. Section II Sensors and Operating Conditions. Electronic Sensors for the Detection of Ovarian Cancer. Sensors and Sensor Systems for Harsh Environment Applications. III-Nitride Electronic Devices for Harsh Environments. Section III Packaging and System Design. Packaging for Systems in Harsh Environments. Corrosion Resistance of Lead-Free Solders under Environmental Stress. From Deep Submicron Degradation Effects to Harsh Operating Environments: A Self-Healing Calibration Methodology for Performance and Reliability Enhancement. Role of Diffusional Interfacial Sliding during Temperature Cycling and Electromigration-Induced Motion of Copper Through Silicon Via.

Kirsten Weide-Zaage, Malgorzata Chrzanowska-Jeske

Reviews for Semiconductor Devices in Harsh Conditions

"""Engineers are developing electronic systems for applications in environments significantly more taxing than those seen in classical computing applications. This book exposes engineers to the range of challenges faced and fosters an understanding of the approaches useful to succeed in those taxing application environments. It has an outstanding overview of the challenges to design electronic systems to operate in the presence of hazards in extreme environments."" —Klaus Schuegraf, Cymer, San Diego, California, USA"


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