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Secondary Electron Energy Spectroscopy In The Scanning Electron Microscope by Anjam Khursheed (Nus, S'pore) at Abbey's Bookshop,
Secondary Electron Energy Spectroscopy In The Scanning Electron Microscope
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Anjam Khursheed (Nus, S'pore)

Secondary Electron Energy Spectroscopy In The Scanning Electron Microscope

Anjam Khursheed (Nus, S'pore)

$212.99

Hardback

Not in-store but you can order this
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English
World Scientific Publishing Co Pte Ltd
26 October 2020
Microscopy
This book deals with the subject of secondary energy spectroscopy in the scanning electron microscope (SEM). The SEM is a widely used research instrument for scientific and engineering research and its low energy scattered electrons, known as secondary electrons, are used mainly for the purpose of nanoscale topographic imaging. This book demonstrates the advantages of carrying out precision electron energy spectroscopy of its secondary electrons, in addition to them being used for imaging. The book will demonstrate how secondary electron energy spectroscopy can transform the SEM into a powerful analytical tool that can map valuable material science information

to the nanoscale, superimposing it onto the instrument's normal topographic mode imaging. The book demonstrates how the SEM can then be used to quantify/identify materials, acquire bulk density of states information, capture dopant density distributions in semiconductor specimens, and map surface charge distributions.
By:  
Imprint:   World Scientific Publishing Co Pte Ltd
Country of Publication:   Singapore
ISBN:   9789811227028
ISBN 10:   9811227020
Pages:   344
Publication Date:  
Audience:   College/higher education ,  Professional and scholarly ,  Primary ,  Undergraduate
Format:   Hardback
Publisher's Status:   Active

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