Scanning Probe Microscopy

The Lab on a Tip

Ernst Meyer, Roland Bennewitz, Hans J. Hug

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English

Springer Nature Switzerland AG
02 June 2022

Mensuration & systems of measurement; Condensed matter physics (liquid state & solid state physics); Spectrum analysis, spectrochemistry, mass spectrometry; Materials science; Testing of materials

Series: Graduate Texts in Physics

Written by three leading experts in the field, this book describes and explains all essential aspects of scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods described. The book covers not only the physical principles behind this popular technique, but also tackles questions on instrument design, the basic features of the different imaging modes, and recurring artifacts. Novel applications and the latest research results are presented, and the book closes with a look at the future prospects of scanning probe microscopy, while also discussing related techniques in the field of nanoscience.

This second edition includes essential scientific updates reflecting the latest research, as well as coverage of new breakthroughs in techniques such as submolecular imaging by atomic force microscopy (AFM), multifrequency AFM, high-speed imaging of biological matter, scanning x-ray microscopy, andtip-enhanced Raman scattering.

The book serves as a general, hands-on guide for all types of classes that address scanning probe microscopy. It is ideally suited for graduate and advanced undergraduate students, either for self-study or as a textbook for a dedicated course on the topic. Furthermore, it is an essential component of any scanning probe microscopy laboratory course and a valuable resource for practicing researchers developing and using scanning probe techniques.

By: Ernst Meyer, Roland Bennewitz, Hans J. Hug
Imprint: Springer Nature Switzerland AG
Country of Publication: Switzerland
Edition: 2nd ed. 2021
Dimensions: Height: 235mm, Width: 155mm,
Weight: 516g
ISBN: 9783030370916
ISBN 10: 3030370917
Series: Graduate Texts in Physics
Pages: 322
Publication Date: 02 June 2022
Audience: Professional and scholarly , Undergraduate
Format: Paperback
Publisher's Status: Active

Ernst Meyer is Professor of Physics at the University of Basel and an expert in the field of atomic force microscopy. He has chaired European programmes for the study of nanotribology and is member of the executive board of the Swiss Nanoscience Institute. His research focuses on scientific questions in the fields of nanomechanics and nanoelectronics. Roland Bennewitz is Professor of Physics at Saarland University and group leader at the Leibniz Institute for New Materials (INM) in Saarbrücken, Germany. His main areas of expertise are high-resolution friction force microscopy, force microscopy of liquid-solid interfaces, and control of adhesion and friction by macromolecular functionalization or ionic liquids. He has chaired international conferences such are the Gordon Research Conference in Tribology 2014 and a Beilstein Symposium on Molecular Mechanisms in Tribology in 2016. He currently serves as on the Editorial Board of the Journal Tribology Letters. Hans Josef Hug is Professor of Physics at the University of Basel and laboratory head at the Empa - Swiss Federal Laboratories for Materials Testing and Research in Dübendorf, near Zürich, where he leads the laboratory for Magnetic and Functional Thin Films. In 2003 he and his team received the Swiss Technology Award for the development of high resolution and quantitative magnetic force microscopy. His main areas of expertise are magnetism and magnetic thin film systems and scanning force microscopy with a particular emphasis on magnetic force microscopy.