This book contains proposals to redesign the scanning electron microscope, so that it is more compatible with other charged particle beam instrumentation and analytical techniques commonly used in surface science research. It emphasizes the concepts underlying spectrometer designs in the scanning electron microscope, and spectrometers are discussed under one common framework so that their relative strengths and weaknesses can be more readily appreciated. This is done, for the most part, through simulations and derivations carried out by the author himself.
The book is aimed at scientists, engineers and graduate students whose research area or study in some way involves the scanning electron microscope and/or charged particle spectrometers. It can be used both as an introduction to these subjects and as a guide to more advanced topics about scanning electron microscope redesign.
By:
Anjam Khursheed (Nus S'pore) Imprint: World Scientific Publishing Co Pte Ltd Country of Publication: Singapore Dimensions:
Height: 229mm,
Width: 155mm,
Spine: 28mm
Weight: 717g ISBN:9789812836670 ISBN 10: 9812836675 Pages: 416 Publication Date:03 November 2010 Audience:
College/higher education
,
Professional and scholarly
,
Primary
,
Undergraduate
Format:Hardback Publisher's Status: Active