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Robust SRAM Designs and Analysis by Jawar Singh at Abbey's Bookshop,
Robust SRAM Designs and Analysis
— —
Jawar Singh Saraju P. Mohanty

Robust SRAM Designs and Analysis

Jawar Singh,  Saraju P. Mohanty,  Dhiraj K. Pradhan

$338.95   $270.76

Hardback

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English
Springer-Verlag New York Inc.
31 July 2012
Precision instruments manufacture; Circuits & components
This book provides a guide to Static Random Access Memory (SRAM) bitcell design and analysis to meet the nano-regime challenges for CMOS devices and emerging devices, such as Tunnel FETs. Since process variability is an ongoing challenge in large memory arrays, this book highlights the most popular SRAM bitcell topologies (benchmark circuits) that mitigate variability, along with exhaustive analysis. Experimental simulation setups are also included, which cover nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis. Emphasis is placed throughout the book on the various trade-offs for achieving a best SRAM bitcell design.

Provides a complete and concise introduction to SRAM bitcell design and analysis;

Offers techniques to face nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis; Includes simulation set-ups for extracting different design metrics for CMOS technology and emerging devices; Emphasizes different trade-offs for achieving the best possible SRAM bitcell design.
By:   , ,
Imprint:   Springer-Verlag New York Inc.
Country of Publication:   United States
Edition:   2012
Dimensions:   Height: 235mm,  Width: 155mm,  Spine: 11mm
Weight:   454g
ISBN:   9781461408178
ISBN 10:   1461408172
Pages:   168
Publication Date:  
Audience:   Professional and scholarly ,  Undergraduate
Format:   Hardback
Publisher's Status:   Active
Introduction to SRAM.- Design Metrics of SRAM Bitcell.- Single-ended SRAM Bitcell Design.- 2-Port SRAM Bitcell Design.- SRAM Bitcell Design Using Unidirectional Devices.- NBTI and its Effect on SRAM.

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