Quantum Metrology with Photoelectrons

Volume I: Foundations

Paul Hockett

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English

Morgan & Claypool Publishers
30 April 2018

Series: IOP Concise Physics

Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications.

The core physics is that of photoionization, and Volume 1 addresses this topic. The foundational material is presented in part as a tutorial with extensive numerical examples and also in part as a collected reference to the relevant theoretical treatments from the literature for a range of cases. Topics are discussed with an eye to developing general quantum metrology schemes, in which full quantum state reconstruction of the photoelectron wavefunction is the goal. In many cases, code and/or additional resources are available online. Consequently, it is hoped that readers at all levels will find something of interest and that the material provides something rather different from existing textbooks.

By: Paul Hockett
Imprint: Morgan & Claypool Publishers
Country of Publication: United States
Dimensions: Height: 254mm, Width: 178mm,
Weight: 825g
ISBN: 9781681749990
ISBN 10: 1681749998
Series: IOP Concise Physics
Pages: 165
Publication Date: 30 April 2018
Audience: General/trade , ELT Advanced
Format: Hardback
Publisher's Status: Active

Paul Hockett earned his PhD in 2008 from the University of Nottingham, UK and joined the National Research Council of Canada in 2009. Paul's research interests cover a range of topics spanning the areas of AMO (atomic, molecular, and optical), quantum, and computational physics (and physical chemistry), with a particular focus on fundamental light-matter interactions, spectroscopy, and application to complex systems.