Pattern Classification

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Richard O. Duda (San Jose State University, California) Peter E. Hart (Ricoh Innovations)

Pattern Classification

Richard O. Duda (San Jose State University, California), Peter E. Hart (Ricoh Innovations), David G. Stork (Ricoh Corporation) , David G. Stork

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English

Wiley-Interscience
26 October 2000

Maths for computer scientists; Pattern recognition

The first edition, published in 1973, has become a classic reference in the field. Now with the second edition, readers will find information on key new topics such as neural networks and statistical pattern recognition, the theory of machine learning, and the theory of invariances. Also included are worked examples, comparisons between different methods, extensive graphics, expanded exercises and computer project topics.

By: Richard O. Duda (San Jose State University California), Peter E. Hart (Ricoh Innovations), David G. Stork (Ricoh Corporation), David G. Stork
Imprint: Wiley-Interscience
Country of Publication: United States
Edition: 2nd edition
Dimensions: Height: 257mm, Width: 185mm, Spine: 38mm
Weight: 1.225kg
ISBN: 9780471056690
ISBN 10: 0471056693
Pages: 688
Publication Date: 26 October 2000
Audience: College/higher education , Professional and scholarly , Professional & Vocational , A / AS level , Further / Higher Education
Replaced By: 9781118456682
Format: Hardback
Publisher's Status: Active

Bayesian Decision Theory. Maximum-Likelihood and Bayesian Parameter Estimation. Nonparametric Techniques. Linear Discriminant Functions. Multilayer Neural Networks. Stochastic Methods. Nonmetric Methods. Algorithm-Independent Machine Learning. Unsupervised Learning and Clustering. Appendix. Index.

RICHARD O. DUDA, PhD, is Professor in the Electrical Engineering Department at San Jose State University, San Jose, California. PETER E. HART, PhD, is Chief Executive Officer and President of Ricoh Innovations, Inc. in Menlo Park, California. DAVID G. STORK, PhD, is Chief Scientist, also at Ricoh Innovations, Inc.

Reviews for Pattern Classification

...it provides a good introduction to the subject of Pattern Classification. (Journal of Classification, September 2007) ...a fantastic book! The presentation...could not be better, and I recommend that future authors consider...this book as a role model. (Journal of Statistical Computation and Simulation, March 2006) ...strongly recommended both as a professional reference and as a text for students... (Technometrics, February 2002) ...provides information needed to choose the most appropriate of the many available technique for a given class of problems. (SciTech Book News, Vol. 25, No. 2, June 2001) I do not believe anybody wishing to teach or do serious work on Pattern Recognition can ignore this book, as it is the sort of book one wishes to find the time to read from cover to cover! (Pattern Analysis & Applications Journal, 2001) This book is the unique text/professional reference for any serious student or worker in the field of pattern recognition. (Mathematical Reviews, Issue 2001k) ...gives a systematic overview about the major topics in pattern recognition, based whenever possible on fundamental principles. (Zentralblatt MATH, Vol. 968, 2001/18) attractively presented and readable (Journal of Classification, Vol.18, No.2 2001)