Nanometrology Using the Transmission Electron Microscope

Vlad Stolojan

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Hardback

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English

Morgan & Claypool Publishers
30 October 2015

Mensuration & systems of measurement; Scientific equipment, experiments & techniques; Engineering measurement & calibration

Series: IOP Concise Physics

The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.

By: Vlad Stolojan
Imprint: Morgan & Claypool Publishers
Country of Publication: United States
ISBN: 9781643278025
ISBN 10: 1643278029
Series: IOP Concise Physics
Pages: 68
Publication Date: 30 October 2015
Audience: General/trade , ELT Advanced
Format: Hardback
Publisher's Status: Active

Introduction The Transmission Electron Microscope Imaging Resolution Image Calibration Sample Orientation Modes of Imaging and Diffraction Spectroscopy Energy-dispersive X-ray Spectroscopy (EDX) Electron Energy Loss Spectroscopy (EELS)

University of Surrey, UK