Mechanical engineering, an engineering discipline forged and shaped by the needs of the industrial revolution, is once again asked to do its substantial share in the call for industrial renewal. The general call is urgent as we face profound issues of productivity and competitiveness that require engineering solutions. The Mechanical Engineering Series features graduate texts and research mono graphs intended to address the need for information in contemporary areas of mechanical engineering. The series is conceived as a comprehensive one that covers a broad range of concentrations important to mechanical engineering graduate education and re search. We are fortunate to have a distinguished roster of consulting editors on the advisory board, each an expert in one of the areas of concentration. The names of the consulting editors are listed on the facing page of this volume. The areas of concentration are applied mechanics, biomechanics, computational me chanics, dynamic systems and control, energetics, mechanics of materials, proc essing, production systems, thermal science, and tribology.
By:
Anthony C. Fischer-Cripps
Imprint: Springer-Verlag New York Inc.
Country of Publication: United States
Edition: 2nd ed. 2004
Dimensions:
Height: 235mm,
Width: 155mm,
Spine: 20mm
Weight: 606g
ISBN: 9780387220451
ISBN 10: 0387220453
Series: Mechanical Engineering Series
Pages: 264
Publication Date: 06 July 2004
Audience:
Professional and scholarly
,
Undergraduate
Replaced By: 9781441998712
Format: Hardback
Publisher's Status: Active
1. Contact Mechanics.- 2. Nanoindentation Testing.- 3. Analysis of Nanoindentation Test Data.- 4. Factors Affecting Nanoindentation Test Data.- 5. Simulation of Nanoindentation Test Data.- 6. Scaling Relationships in Nanoindentation.- 7. Time-Dependent Nanoindentation.- 8. Nanoindentation of Thin Films.- 9. Other Techniques in Nanoindenation.- 10. Nanoindentation Test Standards.- 11. Nanoindentation Test Instruments.- 12. Applications of Nanoindentation Testing.- Appendix 1. Elastic Indentation Stress Fields.- A1.1 Contact Pressure Distributions.- A1.2 Indentation Stress Fields.- A1.2.1 Spherical Indenter.- A1.2.2 Conical Indenter.- Appendix 2. Surface Forces, Adhesion and Friction.- A2.1 Adhesion Forces in Nanoindentation.- A2.2 Forces in Nature.- A2.3 Interaction Potentials.- A2.4 Van der Waals Forces.- A2.5 Surface Interactions.- A2.6 Adhesion.- A2.7 Friction.- Appendix 3. Common Indenter Geometries.- A3.1 Berkovich Indenter.- A3.2 Vickers Indenter.- A3.3 Knoop Indenter.- A3.4 Sphero-Conical Indenter.- Appendix 4. Non-Linear Least Squares Fitting.- Appendix 5. Properties of Materials.- Appendix 6. Frequently Asked Questions.- Appendix 7. Specifications for a Nanoindenter.- A7.1. Instrument Function.- A7.1.1 Loading Techniques.- A7.1.2 Test Schedules and Parameters.- A7.1.3 Indenters.- A7.2 Basic Specifications and Construction.- A7.2.1 Displacement Range, Resolution and Noise Floor.- A7.2.2 Force Range, Resolution and Noise Floor.- A7.2.3 Minimum Contact Load.- A7.2.4 Load Frame Stiffness.- A7.2.5 Loading Mechanism.- A7.2.6 Specimen Height.- A7.3 Specimen Positioning.- A7.4 Specimen Mounting.- A7.5 Optical Microscope and Imaging.- A7.6 Software.- A7.7 Accessories.- A7.8 Instrument Mounting and Isolation.- A7.9 Delivery, Calibration and Warranty.- A7.9.1 Delivery.- A7.9.2 Calibration.- A7.9.3 Warranty.- A7.10 Instrument/Supplier Checklist.
Anthony C. Fischer-Cripps, Ph.D. is the Project Leader for Surface Mechanics, Telecommunications & Industrial Physics at Commonwealth Scientific & Industrial Research Organization in Lindfield, Sydney, Australia.
Reviews for Nanoindentation
"From the reviews: ""This book presents a comprehensive and detailed overview of the field of nanoindentation. … Also covered are the various methods of testing, details of an international standard for depth-sensing … . Self-contained, the treatment is aimed at those entering the field, but by bringing together material scattered widely throughout the research literature the book will also be a useful reference for the more experienced researcher."" (Zeitschrift für Kristallographie, Issue 9-10, 2005)"
