Introduction to Optical Metrology

Rajpal S. Sirohi (Austin, Texas, USA)

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English

CRC Press
26 September 2025

Light (optics); Instruments & instrumentation engineering; Electrical engineering; Electronic devices & materials; Laser technology & holography

Series: Optical Sciences and Applications of Light

This book describes both the theory and practice of optical techniques to measure various parameters encountered routinely in science and engineering.

Introduction to Optical Metrology, Second Edition, examines the theory and practice of various measurement methodologies utilizing both the corpuscular and the wave nature of light. The book begins by introducing the subject of optics and then addresses the propagation of laser beams through free space and optical systems. It discusses interferometry, holography, speckle metrology, the moiré phenomenon, photoelasticity, and microscopy. The remaining chapters describe techniques and methods of measurements of refractive index, thickness, radii of curvature, angle, velocity, pressure, length, optical testing, and fiber-optic-based methods. Apart from these, this edition includes a chapter on temperature measurement, sections on fringe unwrapping methods, testing of free-form optics, shearography, etc. Featuring new and updated exercise problems at the end of each chapter, this edition provides an applied understanding of essential optical measurement concepts, techniques, and procedures.

The primary audience for this book is undergraduate and graduate students who specialize in optics. It will also be useful to researchers and professionals working on optical testing and fiber-optic-based and MEMS-based measurements. A solutions manual and figure slides are available for adopting professors.

By: Rajpal S. Sirohi (Austin Texas USA)
Imprint: CRC Press
Country of Publication: United Kingdom
Edition: 2nd edition
Dimensions: Height: 234mm, Width: 156mm,
Weight: 453g
ISBN: 9781032872797
ISBN 10: 1032872799
Series: Optical Sciences and Applications of Light
Pages: 452
Publication Date: 26 September 2025
Audience: College/higher education , Professional and scholarly , Primary , Undergraduate
Format: Hardback
Publisher's Status: Forthcoming

Rajpal S. Sirohi served as Professor of Physics at IIT Madras for more than two decades and as Director of IIT Delhi and Vice Chancellor to several Universities in India. He was a Distinguished Scholar at the Rose-Hulman Institute of Technology, Terre Haute, Indiana; Chair Professor at Tezpur University, Assam, India; and Faculty at Alabama A&M University, Huntsville, Alabama. Professor Rajpal S. Sirohi is now retired and spends his time reading books on the history of science and spends mornings and evenings with his grandchildren. His research areas are optical metrology, optical instrumentation, laser instrumentation, holography, and speckle phenomenon.