Introduction to Conventional Transmission Electron Microscopy

Marc De Graef (Carnegie Mellon University, Pennsylvania)

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English

Cambridge University Press
01 July 2003

Microscopy; Condensed matter physics (liquid state & solid state physics); Solid state chemistry; Surface chemistry & adsorption; Materials science

This book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website

containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing

a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field.

By: Marc De Graef (Carnegie Mellon University Pennsylvania)
Imprint: Cambridge University Press
Country of Publication: United Kingdom
Dimensions: Height: 244mm, Width: 170mm, Spine: 38mm
Weight: 1.160kg
ISBN: 9780521629959
ISBN 10: 0521629950
Pages: 742
Publication Date: 01 July 2003
Audience: Professional and scholarly , College/higher education , Undergraduate , Primary
Format: Paperback
Publisher's Status: Active

1. Basic crystallography; 2. Basic quantum mechanics; 3. The transmission electron microscope; 4. Getting started; 5. Dynamical electron scattering in perfect crystals; 6. Two-beam theory in defect-free crystals; 7. Systematic row and zone axis orientations; 8. Defects in crystals; 9. Electron diffraction patterns; 10. Phase contrast microscopy; Appendices.

Professor of Materials Science and Engineering at Carnegie Mellon University.

Reviews for Introduction to Conventional Transmission Electron Microscopy

'... ideal for students as well as for researchers new to the field.' Materials World 'The inner workings of the TEM are described comprehensively, from both a theoretical and practical point of view ... engagingly written ... This book aims to be a practical introduction and guide to TEM and achieves this extremely well.' Materials World '... a clear and extremely well-illustrated do-it-yourself book on conventional TEM of crystals and their defects.' Ultramicroscopy 'The introduction to each chapter is engagingly written, generally beginning with some historic or real-world examples before getting into the mathematics behind the machine. This serves to whet the reader's appetite for more information as the chapters lead into well written mathematical theory ... The book aims to be a practical introduction and guide to TEM and achieves this extremely well. Any student who reads this book from cover to cover and follows the examples given will be well on their way to performing useful TEM evaluation.' Materials World