Fundamentals of Pattern Recognition and Machine Learning

Ulisses Braga-Neto

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English

Springer International Publishing AG
07 August 2024

Biology, life sciences; Machine learning; Pattern recognition; Image processing

This book is a concise but thorough introduction to the tools commonly used in pattern recognition and machine learning, including classification, dimensionality reduction, regression, and clustering, as well as recent popular topics such as deep neural networks and Gaussian process regression. The Second Edition is thoroughly revised, featuring a new chapter on the emerging topic of physics-informed machine learning and additional material on deep neural networks.

Combining theory and practice, this book is suitable for the graduate or advanced undergraduate level classroom and self-study. It fills the need of a mathematically-rigorous text that is relevant to the practitioner as well, with datasets from applications in bioinformatics and materials informatics used throughout to illustrate the theory. These datasets are available from the book website to be used in end-of-chapter coding assignments based on python and Keras/Tensorflow. All plots in the text were generated using python scripts and jupyter notebooks, which can be downloaded from the book website.

By: Ulisses Braga-Neto
Imprint: Springer International Publishing AG
Country of Publication: Switzerland
Edition: Second Edition 2024
Dimensions: Height: 254mm, Width: 178mm,
ISBN: 9783031609497
ISBN 10: 3031609492
Pages: 400
Publication Date: 07 August 2024
Audience: Professional and scholarly , Undergraduate
Format: Hardback
Publisher's Status: Active

Introduction.- Optimal Classification.- Sample-Based Classification.- Parametric Classification.- Nonparametric Classification.- Function-Approximation Classification.- Error Estimation for Classification.- Model Selection for Classification.- Dimensionality Reduction.- Clustering.- Regression.- Bayesian Machine Learning.- Scientific.- Machine Learning.- Appendices.

Ulisses Braga-Neto, Ph.D. is a Professor in the Department of Electrical and Computer Engineering at Texas A&M University. His main research areas are pattern recognition, machine learning, statistical signal processing, and applications in bioinformatics and materials informatics. He has worked extensively in the field of error estimation for pattern recognition and machine learning, having received an NSF CAREER award for research in this area, and co-authored a monograph with Edward R. Dougherty on the topic. He has also made contributions to the field of Mathematical morphology in signal and image processing.

Reviews for Fundamentals of Pattern Recognition and Machine Learning

“The style of the book, with its numerous examples, exercises and references, recommends it for a broad audience from students to researchers. The style is comprehensive, yet approachable, and the incremental increase in difficulty, strengthened by the ties with previous chapters, makes it easy to go back and forth between concepts and adapts the theoretical aspects to a wide variety of machine learning tasks.” (Irina Ioana Mohorianu, zbMATH 1555.68003, 2025)