Electron Microscopy and Analysis

Peter J. Goodhew, John Humphreys (The University of Manchester, England, UK), Richard Beanland (GEC-Marconi Materials Technology, England, UK)

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English

CRC Press
07 July 2017

Light (optics); Materials science; Electrical engineering; Environmental science, engineering & technology; Image processing

Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.

By: Peter J. Goodhew, John Humphreys (The University of Manchester, England, UK), Richard Beanland (GEC-Marconi Materials Technology, England, UK)
Imprint: CRC Press
Country of Publication: United Kingdom
Edition: 3rd edition
Dimensions: Height: 234mm, Width: 156mm,
Weight: 453g
ISBN: 9781138441538
ISBN 10: 1138441538
Pages: 264
Publication Date: 07 July 2017
Audience: Professional and scholarly , Undergraduate
Format: Hardback
Publisher's Status: Active

Preface; Abbreviations; 1. Microscopy with Light and Electrons 2. Electrons and Their Interaction with the Specimen 3. Electron Diffraction 4. The Transmission Electron Microscope 5. The Scanning Electron Microscope 6. Chemical Analysis in the Electron Microscope 7. Electron Microscopy and Other Techniques; Further Reading; Index

Peter J. Goodhew, John Humphreys The University of Manchester, Richard Beanland GEC Marconi Materials Technology, England.