Development of Methods for Characterisation of Roughness in Three Dimensions

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Ken J Stout Liam Blunt (Taylor Hobson Professor of Surface Metrology at the University of Huddersfield, UK)

Development of Methods for Characterisation of Roughness in Three Dimensions

Ken J Stout, Liam Blunt (Taylor Hobson Professor of Surface Metrology at the University of Huddersfield, UK), W. P. Dong , E. Mainsah

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English

Penton Press
01 June 2002

Engineering: general; Engineering measurement & calibration; Production engineering

Based on research funded by the European Commission, this important handbook provides a basis for a unified approach to three-dimensional surface finish assessment. It covers a broad range of issues related to 3-D micro-topography, with particular emphasis on standardisation, measurement, characterisation and interpretation. This reprint includes an updating introductory section. This work is to be the basis for a 3D international standard.

By: Ken J Stout, Liam Blunt (Taylor Hobson Professor of Surface Metrology at the University of Huddersfield, UK), W. P. Dong, E. Mainsah, N. Luo
Imprint: Penton Press
Country of Publication: United Kingdom
Edition: 2nd Revised edition
Dimensions: Height: 297mm, Width: 210mm, Spine: 23mm
Weight: 1.010kg
ISBN: 9781857180237
ISBN 10: 1857180232
Pages: 384
Publication Date: 01 June 2002
Audience: Professional and scholarly , Undergraduate
Format: Paperback
Publisher's Status: Active

Professor Liam Blunt is Taylor Hobson Professor of Surface Metrology at the University of Huddersfield, UK. He is author of numerous published papers and other contributions on surface technology, and is co-author with Ken Stout of Three Dimensional Surface Topography (published by Penton Press, 2000).