Data Quality

The Accuracy Dimension

Jack E. Olson (Chief Technology Officer, NEON Enterprise Software)

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Paperback

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English

Morgan Kaufmann Publishers In
26 December 2002

Library, archive & information management; Enterprise software; Maintenance & repairs; Database programming; Databases

Series: The Morgan Kaufmann Series in Data Management Systems

Data Quality: The Accuracy Dimension is about assessing the quality of corporate data and improving its accuracy using the data profiling method. Corporate data is increasingly important as companies continue to find new ways to use it. Likewise, improving the accuracy of data in information systems is fast becoming a major goal as companies realize how much it affects their bottom line. Data profiling is a new technology that supports and enhances the accuracy of databases throughout major IT shops. Jack Olson explains data profiling and shows how it fits into the larger picture of data quality.

By: Jack E. Olson (Chief Technology Officer NEON Enterprise Software)
Imprint: Morgan Kaufmann Publishers In
Country of Publication: United States
Dimensions: Height: 229mm, Width: 151mm, Spine: 16mm
Weight: 390g
ISBN: 9781558608917
ISBN 10: 1558608915
Series: The Morgan Kaufmann Series in Data Management Systems
Pages: 312
Publication Date: 26 December 2002
Audience: Professional and scholarly , Undergraduate
Format: Paperback
Publisher's Status: Active

Preface. Acknowledgements. Forward. Part 1: Understanding Data Accuracy: The Data Quality Problem. Definition of Accurate Data. Sources of Inaccurate Data. Part 2: Implementing a Data Quality Assurance Program: Data Quality Assurance. Data Quality Issues Management. The Business Case for Accurate Data. Part 3: Data Profiling Technology: Data Profiling Overview. Column Property Analysis. Structure Analysis. Single Data Rule Analysis. Complex Object Data Rule Analysis. Value Rule Analysis. Summary. Appendixes : Example of Column Properties, Data Structure, Data Rules and Value Rules. Content of Data Profiling Repository. Bibliography. Index.

Jack E. Olson is a widely recognized database technology expert. His career includes significant contributions at IBM, BMC, Evoke, and now NEON Enterprise Software, where he serves as Chief Technology Office. Olson is author of Data Quality: The Accuracy Dimension, also published by Morgan Kaufmann. The inventor of record on several patents, he holds a BS from the Illinois Institute of Technology and an MBA from Northwestern University.