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Automating Software Defect Detection Through Machine Learning and Llms

Bryan Gardiner Pancham Singh Prashant Upadhyay Meetu Malhotra

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English
Engineering Science Reference
29 August 2025

Automating Software Defect Detection Through Machine Learning and Llms by Bryan Gardiner

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Edited by:   , , , ,
Imprint:   Engineering Science Reference
Country of Publication:   United States
ISBN:   9798337344607
Pages:   550
Publication Date:  
Audience:   College/higher education ,  Professional and scholarly ,  Primary ,  Undergraduate
Format:   Hardback
Publisher's Status:   Active

Pancham Singh is currently working as an Assistant Professor in the Department of Information Technology at AKGEC, Ghaziabad since 2007. Mr. Singh has over 18 years of teaching and one year of industry experiences. Mr. Singh received a B.Tech. Degree in Computer Science & Engineering from Dr. A.P.J. Abdul Kalam Technical University (formerly, UPTU), Lucknow, Uttar Pradesh, India in 2005; a Master Degree in Information Technology from RTU, Kota, Rajasthan, India in 2013 and a Pursuing PhD from Netaji Subhas University of Technology (NSUT), New Delhi, India since january 2023. In addition he has authored 3 books in Computer Science. He has presented and published more than 40 papers in international journals and conferences. He has reviewed more 50 papers for the International Journals and Conferences. In addition he has published 20 National and International Patents and 3 Design Grants. He was the session chair for the International Conference ICDT 2024. In addition, He did work as a time table In-charge since 2010 to 2023 for more than 13 yrs also media In-charge since 2015 to 2023 for more than 8 yrs in AKGEC. He did Flying Squad Duty assigned by AKTU as a In-charge and team member 4 times. He has attended more than 30 FDPs and did work as a In-charge and member for NBA and NACC in AKGEC. His research interests are Machine Learning, Deep Learning, Blockchain, Internet of Things, and Software Engineering.

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