Atomic-Scale Analytical Tomography

Concepts and Implications

Thomas F. Kelly, Brian P. Gorman (Colorado School of Mines), Simon P. Ringer (University of Sydney)

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English

Cambridge University Press
24 March 2022

Materials science

Series: Advances in Microscopy and Microanalysis

A comprehensive guide on Atomic-Scale Analytical Tomography (ASAT) that discusses basic concepts and implications of the technique in areas such as material sciences, microscopy, engineering sciences and several interdisciplinary avenues. The title interrogates how to successfully achieve ASAT at the intersection of transmission electron microscopy and atom probe microscopy. This novel concept is capable of identifying individual atoms in large volumes as well as in 3D, with high spatial resolution. Written by leading experts from academia and industry, this book serves as a guide with real-world applications on cutting-edge research problems. An essential reading for researchers, engineers and practitioners interested in nanoscale characterisation, this book introduces the reader to a new direction for atomic-scale microscopy.

By: Thomas F. Kelly, Brian P. Gorman (Colorado School of Mines), Simon P. Ringer (University of Sydney)
Imprint: Cambridge University Press
Country of Publication: United Kingdom
Edition: New edition
Dimensions: Height: 250mm, Width: 175mm, Spine: 18mm
Weight: 630g
ISBN: 9781107162501
ISBN 10: 1107162505
Series: Advances in Microscopy and Microanalysis
Pages: 300
Publication Date: 24 March 2022
Audience: General/trade , ELT Advanced
Format: Hardback
Publisher's Status: Active

Thomas F. Kelly is a pioneer in the field of atomic-scale research. He was a professor of Materials Science and Engineering at the University of Wisconsin-Madison for 18 years prior to founding Imago Scientific Instruments (later acquired by CAMECA) to commercialize his invention, the local electrode atom probe (LEAP). Currently, Dr Kelly is Founder and CEO of Steam Instruments, Inc., is a Fellow of the Microscopy Society of America, the International Field Emission Society, the Microanalysis Society, and the Korean Society for Microscopy. He was recently elected to the US National Academy of Engineering. Brian P. Gorman is a Professor of Metallurgical and Materials Engineering at the Colorado School of Mines. His group has been developing experimental methods, hardware, and data analysis techniques for correlative electron microscopy and atom probe tomography since 2006. Simon P. Ringer is an engineer and leading researcher in atomic-scale materials design. A Professor in materials engineering in the School of Aerospace, Mechanical and Mechatronic Engineering, and an academic member and former Director of the Australian Centre for Microscopy & Microanalysis at the University of Sydney, he is presently Director of the Core Research Facilities at the University. He is a Fellow of the Institution of Engineers Australia, and a Fellow of the Australian Academy of Technology and Engineering.

Reviews for Atomic-Scale Analytical Tomography: Concepts and Implications

'The quest for making better materials is ultimately linked to understanding the role of each individual atom in its place and its chemical environment. Three pioneers in the field guide us through a comprehensive scenario of how this can be achieved by combining the two most advanced atomic-scale characterization techniques: atom probe tomography and transmission electron microscopy.' Joachrim Mayer, RWTH Aachen University