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Applied Measurement with jMetrik

J. Patrick Meyer (University of Virginia, USA)

$101

Paperback

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English
Routledge
25 June 2014
jMetrik is a computer program for implementing classical and modern psychometric methods. It is designed to facilitate work in a production environment and to make advanced psychometric procedures accessible to every measurement practitioner. Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis. Each chapter focuses on a topic in measurement, describes the steps for using jMetrik, and provides one or more examples of conducting an analysis on the topic. Recommendations and guidance for practice is provided throughout the book.

By:  
Imprint:   Routledge
Country of Publication:   United Kingdom
Dimensions:   Height: 229mm,  Width: 152mm,  Spine: 15mm
Weight:   294g
ISBN:   9780415531979
ISBN 10:   0415531977
Pages:   170
Publication Date:  
Audience:   College/higher education ,  General/trade ,  Primary ,  ELT Advanced
Format:   Paperback
Publisher's Status:   Active

J. Patrick Meyer is an associate professor in the Curry School of Education at the University of Virginia

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