Advances in X-ray Absorption Fine Structure Analysis

Zhongrui (jerry) Li

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English

Central West Publishing
15 November 2020

Reference; Spectrum analysis, spectrochemistry, mass spectrometry; Engineering measurement & calibration; Materials science

Series: Materials Science

This book provides a comprehensive, theoretical, practical, and thorough guide to current X-ray absorption fine structure (XAFS) spectroscopy and modern applications. It contains the experimental and theoretical aspects of XAFS in 14 chapters based on recent developments in the XAFS approach to science and technology, describing the basic principles and theories, calculation methods, computer programs, advanced methodologies and techniques, experiments, data analysis and interpretation and applications. Among the broad XAFS subjects of synchrotron radiation applications, the book specifically covers EXAFS, XANES and NEXAFS, AXAFS, DAFS, XMCD, MEXAFS, XMLD, and X-ray natural dichroism (XNCD and XNLD).

This book may serve as a reference book for researchers and technicians taking up synchrotron radiation application research and postgraduates majoring in the X-ray absorption spectroscopy field. It will provide the beginners with all the necessary information in the field of XAFS. Also, experienced users active in particular subfields of XAFS spectroscopies will learn in this book about the enormous potential of XAFS for other applications in physics, chemistry, biology, materials science and engineering, geo- and environmental science, etc.

For more details, please visit https: //centralwestpublishing.com

s book provides a comprehensive, theoretical, practical, and thorough guide to current X-ray absorption fine structure (XAFS) spectroscopy and modern applications. It contains the experimental and theoretical aspects of XAFS in 14 chapters based on recent developments in the XAFS approach to science and technology, describing the basic principles and theories, calculation methods, computer programs, advanced methodologies and techniques, experiments, data analysis and interpretation and applications. Among the broad XAFS subjects of synchrotron radiation applications, the book specifically covers EXAFS, XANES and NEXAFS, AXAFS, DAFS, XMCD, MEXAFS, XMLD, and X-ray natural dichroism (XNCD and XNLD).

By: Zhongrui (jerry) Li
Imprint: Central West Publishing
Dimensions: Height: 229mm, Width: 152mm, Spine: 21mm
Weight: 531g
ISBN: 9781925823882
ISBN 10: 1925823881
Series: Materials Science
Pages: 400
Publication Date: 15 November 2020
Audience: General/trade , ELT Advanced
Format: Paperback
Publisher's Status: Active

Zhongrui (Jerry) Li, received Ph.D. in chemical physics from the University of Science and Technology of China in 2000. His research is in the area of advanced spectroscopy and material science with main focus on synchrotron radiation- based X-ray absorption fine structure spectroscopy and carbon nanotubes. He has been working on XAFS for more than 25 years and has published more than 120 articles in these fields with h-index 40 and over 6500 citations.