Advanced Mathematical And Computational Tools In Metrology Iv

— —

"Patrizia Ciarlini (Inst Per Le Applicazione Del Calcolo ""M Picone"", Roma, Italy)" Franco Pavese (Imeko Tc21, Italy)

Advanced Mathematical And Computational Tools In Metrology Iv

"Patrizia Ciarlini (Inst Per Le Applicazione Del Calcolo ""M Picone"", Roma, Italy)", Franco Pavese (Imeko Tc21, Italy), Caparica D Richter (Physikalisch-technische Bundesanstalt, Germany) , Alistair B Forbes (Nat'l Physical Lab, Uk)

$264.99

Hardback

Not in-store but you can order this
How long will it take?

Availability Information

We source books from suppliers in Australia and overseas. For books we don't currently have in stock, the time it takes to get them from our suppliers can vary widely - from a few days to a few months - so we check each book with each supplier to determine the expected time it will take to be supplied to us.

We then advise you accordingly. If the time taken to get any book is too long for you, you can let us know and we will cancel or adjust your order, and refund as required.

To find out the anticipated arrival time for specific items prior to ordering, please contact us by phone or email:

Phone +61 2 9264 3111, or 1800 4 BOOKS (1800 4 26657) if outside Sydney:
option 1 Abbey's Bookshop (Crime, History, Science, Kids & more) • info@abbeys.com.au
option 2 Language Book Centre (ESL & Foreign Languages) • language@abbeys.com.au
option 3 Galaxy Bookshop (Sci-fi, Fantasy, Romance, Graphic Novels) • sf@galaxybooks.com.au

QTY:

English

World Scientific Publishing Co Pte Ltd
25 January 2000

Applied mathematics; Scientific standards; Scientific equipment, experiments & techniques; Computer science

Series: Series on Advances in Mathematics for Applied Sciences

Summary
Details

Advances in metrology depend upon improvements in scientific and technical knowledge and in instrumentation quality, as well as better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, should benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes. The book should be of interest to people in universities, research centres and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and to those developing such mathematical tools.

Edited by: "Patrizia Ciarlini (Inst Per Le Applicazione Del Calcolo ""M Picone"" Roma Italy)", Franco Pavese (Imeko Tc21, Italy), Caparica D Richter (Physikalisch-technische Bundesanstalt, Germany), Alistair B Forbes (Nat'l Physical Lab, Uk), D. Richter (Physikalisch-Technische Bundesanstalt, Berlin, Germany)
Imprint: World Scientific Publishing Co Pte Ltd
Country of Publication: Singapore
Volume: 53
Dimensions: Height: 230mm,
ISBN: 9789810242169
ISBN 10: 9810242166
Series: Series on Advances in Mathematics for Applied Sciences
Pages: 336
Publication Date: 25 January 2000
Audience: College/higher education , Professional and scholarly , Professional & Vocational , A / AS level , Further / Higher Education
Format: Hardback
Publisher's Status: Active