Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions

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Ch Sateesh Kumar (University of Johannesburg, South Africa) M. Muralidhar Singh (Madanapalle Institute of Technology & Science, India)

Advanced Materials Characterization

Basic Principles, Novel Applications, and Future Directions

Ch Sateesh Kumar (University of Johannesburg, South Africa), M. Muralidhar Singh (Madanapalle Institute of Technology & Science, India), Ram Krishna (Department of Metallurgical and Materials Engineering, NIT, Jamshedpur, India)

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English

CRC Press
29 November 2024

Spectrum analysis, spectrochemistry, mass spectrometry; Instruments & instrumentation engineering

Series: Advanced Materials Processing and Manufacturing

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis.

Features:

Covers material characterization techniques and the development of advanced characterization technology

Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints

Discusses advanced material characterization technology in the microstructural and property characterization fields

Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties

Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies

This book is aimed at graduate students and researchers in materials science and engineering.

By: Ch Sateesh Kumar (University of Johannesburg South Africa), M. Muralidhar Singh (Madanapalle Institute of Technology & Science, India), Ram Krishna (Department of Metallurgical and Materials Engineering, NIT, Jamshedpur, India)
Imprint: CRC Press
Country of Publication: United Kingdom
Dimensions: Height: 234mm, Width: 156mm,
Weight: 270g
ISBN: 9781032375113
ISBN 10: 1032375116
Series: Advanced Materials Processing and Manufacturing
Pages: 130
Publication Date: 29 November 2024
Audience: Professional and scholarly , Undergraduate
Format: Paperback
Publisher's Status: Active

1.Introduction to material characterization 2. X-Ray Diffraction (XRD) 3. Nanomechanical system 4. X-Ray photo spectroscopy (XPS) 5. Scanning electron microscope (SEM) 6. Field emission scanning electron microscope (FESEM) 7. Transmission electron microscope (TEM) 8. Atomic Force Microscope (AFM) 9. Near-field scanning optical microscope Raman 10. Optical characterization instruments 11. Synchrotron techniques 12. Other advanced instruments used for characterization of functionally graded materials