Pattern recognition presents one of the most significant challenges for scientists and engineers, and many different approaches have been proposed. The aim of this book is to provide a self-contained account of probabilistic analysis of these approaches. The book includes a discussion of distance measures, nonparametric methods based on kernels or nearest neighbors, Vapnik-Chervonenkis theory, epsilon entropy, parametric classification, error estimation, free classifiers, and neural networks. Wherever possible, distribution-free properties and inequalities are derived. A substantial portion of the results or the analysis is new. Over 430 problems and exercises complement the material.
By:
Luc Devroye, Laszlo Györfi, Gabor Lugosi Imprint: Springer-Verlag New York Inc. Country of Publication: United States Edition: Softcover reprint of the original 1st ed. 1996 Volume: 31 Dimensions:
Height: 235mm,
Width: 155mm,
Spine: 34mm
Weight: 997g ISBN:9781461268772 ISBN 10: 146126877X Series:Stochastic Modelling and Applied Probability Pages: 638 Publication Date:22 November 2013 Audience:
Professional and scholarly
,
Undergraduate
Format:Paperback Publisher's Status: Active
Preface * Introduction * The Bayes Error * Inequalities and alternate distance measures * Linear discrimination * Nearest neighbor rules * Consistency * Slow rates of convergence Error estimation * The regular histogram rule * Kernel rules Consistency of the k-nearest neighbor rule * Vapnik-Chervonenkis theory * Combinatorial aspects of Vapnik- Chervonenkis theory * Lower bounds for empirical classifier selection * The maximum likelihood principle * Parametric classification * Generalized linear discrimination * Complexity regularization * Condensed and edited nearest neighbor rules * Tree classifiers * Data- dependent partitioning * Splitting the data * The resubstitution estimate * Deleted estimates of the error probability * Automatic kernel rules * Automatic nearest neighbor rules * Hypercubes and discrete spaces * Epsilon entropy and totally bounded sets * Uniform laws of large numbers * Neural networks * Other error estimates * Feature extraction * Appendix * Notation * References * Index