Microprobe Characterization of Optoelectronic Materials

Juan Jimenez (University of Valladolid, Spain)

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English

CRC Press Inc
15 November 2002

Electricity, electromagnetism & magnetism; Materials science; Semi-conductors & super-conductors; Fibre optics

Each chapter in this book is written by a group of experts in one particular type of microprobe technique. They emphasize the ability of that technique to provide information about small structures (quantum dots, quantum lines), microscopic defects, strain, layer composition, and its usefulness as diagnostic techniques for device degradation. Different types of probes are considered (electrons, photon and tips) and different microscopies (optical, electron microscopy and tunnelling). It is a reference for post-graduate and experienced researchers, as well as for crystal growers and optoelectronic device makers.

By: Juan Jimenez (University of Valladolid Spain)
Imprint: CRC Press Inc
Country of Publication: United States
Dimensions: Height: 229mm, Width: 152mm, Spine: 45mm
Weight: 1.065kg
ISBN: 9781560329411
ISBN 10: 1560329416
Pages: 730
Publication Date: 15 November 2002
Audience: College/higher education , Professional and scholarly , Further / Higher Education , Undergraduate
Format: Hardback
Publisher's Status: Active

Juan Jiménez is a Professor at the University of Valladolid, Spain, working in the field of microscopic characterization of semiconductors, using electron (Cathodoluminescence) and optical (photoluminescence, Raman scattering and photocurrent) beams. He has studied the local properties and uniformity of GaAs, SiC, InP and other semiconductors. He received his degree in Physics from the University of Valladolid in 1975 and his PhD from Valladolid in 1979. He undertook postdoctoral work at the University of Montpellier, France from 1978-1981 and received a PhD from Montpellier University in 1981.