Sputtered Thin Films

Theory and Fractal Descriptions

Frederick Madaraka Mwema, Esther Titilayo Akinlabi, Oluseyi Philip Oladijo

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English

CRC Press
25 September 2023

Crystallography; Materials science

Series: Engineering Materials

Sputtered Thin Films: Theory and Fractal Descriptions provides an overview of sputtered thin films and demystifies the concept of fractal theory in analysis of sputtered thin films. It simplifies the use of fractal tools in studying the growth and properties of thin films during sputtering processes. Part 1 of the book describes the basics and theory of thin film sputtering and fractals. Part 2 consists of examples illustrating specific descriptions of thin films using fractal methods.

Discusses thin film growth, structure, and properties

Covers fractal theory

Presents methods of fractal measurements

Offers typical examples of fractal descriptions of thin films grown via magnetron sputtering processes

Describes application of fractal theory in prediction of thin film growth and properties

This reference book is aimed at engineers and scientists working across a variety of disciplines including materials science and metallurgy as well as mechanical, manufacturing, electrical, and biomedical engineering.

By: Frederick Madaraka Mwema, Esther Titilayo Akinlabi, Oluseyi Philip Oladijo
Imprint: CRC Press
Country of Publication: United Kingdom
Dimensions: Height: 234mm, Width: 156mm,
Weight: 453g
ISBN: 9780367513603
ISBN 10: 0367513609
Series: Engineering Materials
Pages: 196
Publication Date: 25 September 2023
Audience: College/higher education , General/trade , Primary , ELT Advanced
Format: Paperback
Publisher's Status: Active

Part 1. Theory. 1. Thin Film Growth, Structure, and Properties. 2. Fractal Theory. 3. Methods of Fractal Measurements. Part 2. Typical Studies of Fractal Descriptions of Sputtered Films. 4. Fractal Characterization of Hillocks and Porosity in Sputtered Films. 5. Fractal Analyses of Roughness of Sputtered Films. 6. Multifractal Characterization of Structure Evolution with Sputtering Parameters of Thin Films. 7. Fractal Prediction of Film Growth and Properties.