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Semiconductor Devices in Harsh Conditions

Kirsten Weide-Zaage Malgorzata Chrzanowska-Jeske

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English
CRC Press
30 September 2020
This book introduces the reader to a number of challenges for the operation of electronic devices in various harsh environmental conditions. While some chapters focus on measuring and understanding the effects of these environments on electronic components, many also propose design solutions, whether in choice of material, innovative structures, or strategies for amelioration and repair. Many applications need electronics designed to operate in harsh environments. Readers will find, in this collection of topics, tools and ideas useful in their own pursuits and of interest to their intellectual curiosity.

With a focus on radiation, operating conditions, sensor systems, package, and system design, the book is divided into three parts. The first part deals with sensing devices designed for operating in the presence of radiation, commercials of the shelf (COTS) products for space computing, and influences of single event upset. The second covers system and package design for harsh operating conditions. The third presents devices for biomedical applications under moisture and temperature loads in the frame of sensor systems and operating conditions.

Edited by:   ,
Imprint:   CRC Press
Country of Publication:   United Kingdom
Dimensions:   Height: 234mm,  Width: 156mm, 
Weight:   471g
ISBN:   9780367656362
ISBN 10:   0367656361
Series:   Devices, Circuits, and Systems
Pages:   234
Publication Date:  
Audience:   College/higher education ,  A / AS level ,  Further / Higher Education
Format:   Paperback
Publisher's Status:   Active

Kirsten Weide-Zaage, Malgorzata Chrzanowska-Jeske

Reviews for Semiconductor Devices in Harsh Conditions

"""Engineers are developing electronic systems for applications in environments significantly more taxing than those seen in classical computing applications. This book exposes engineers to the range of challenges faced and fosters an understanding of the approaches useful to succeed in those taxing application environments. It has an outstanding overview of the challenges to design electronic systems to operate in the presence of hazards in extreme environments."" —Klaus Schuegraf, Cymer, San Diego, California, USA"


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