High-Resolution Electron Microscopy

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John C. H. Spence (Regents' Professor of Physics, Regents' Professor of Physics, Arizona State University)

High-Resolution Electron Microscopy

John C. H. Spence (Regents' Professor of Physics, Regents' Professor of Physics, Arizona State University)

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English

Oxford University Press
29 December 2016

Microscopy; Condensed matter physics (liquid state & solid state physics); Crystallography; Materials science

This new fourth edition of the standard text on atomic-resolution transmission electron microscopy (TEM) retains previous material on the fundamentals of electron optics and aberration correction, linear imaging theory (including wave aberrations to fifth order) with partial coherence, and multiple-scattering theory. Also preserved are updated earlier sections on practical methods, with detailed step-by-step accounts of the procedures needed to obtain the highest quality images of atoms and molecules using a modern TEM or STEM electron microscope. Applications sections have been updated - these include the semiconductor industry, superconductor research, solid state chemistry and nanoscience, and metallurgy, mineralogy, condensed matter physics, materials science and material on cryo-electron microscopy for structural biology. New or expanded sections have been added on electron holography, aberration correction, field-emission guns, imaging filters, super-resolution methods, Ptychography, Ronchigrams, tomography, image quantification and simulation, radiation damage, the measurement of electron-optical parameters, and detectors (CCD cameras, Image plates and direct-injection solid state detectors). The theory of Scanning transmission electron microscopy (STEM) and Z-contrast are treated comprehensively. Chapters are devoted to associated techniques, such as energy-loss spectroscopy, Alchemi, nanodiffraction, environmental TEM, twisty beams for magnetic imaging, and cathodoluminescence. Sources of software for image interpretation and electron-optical design are given.

By: John C. H. Spence (Regents' Professor of Physics Regents' Professor of Physics Arizona State University)
Imprint: Oxford University Press
Country of Publication: United Kingdom
Edition: 4th Revised edition
Dimensions: Height: 245mm, Width: 172mm, Spine: 23mm
Weight: 806g
ISBN: 9780198795834
ISBN 10: 0198795831
Pages: 428
Publication Date: 29 December 2016
Audience: Professional and scholarly , Professional and scholarly , Undergraduate , Undergraduate
Format: Paperback
Publisher's Status: Active

1: Preliminaries 2: Electron Optics 3: Wave Optics 4: Coherence and Fourier Optics 5: Imaging Thin Crystals and their Defects 6: Imaging Molecules: Radiation Damage 7: Image Processing, Super-Resolution, Diffractive Imaging 8: STEM and Z-contrast 9: Electron Sources and Detectors 10: Measurement of Electron-Optical Parameters 11: Instabilities and the Microscope Environment 12: Experimental Methods 13: Associated Techniques and Software Resources Appendices

John C. H. Spence is Regents' Professor of Physics at Arizona State University with a joint appointment at Lawrence Berkeley Laboratory. He completed a PhD in Physics at Melbourne University in Australia, followed by postdoctoral work in Materials Science at Oxford University, UK. He is a Fellow of the American Physical Society, of the Institute of Physics, of the American Association for the Advancement of Science, and of Churchill College Cambridge, UK. He is a recent co-editor of Acta Crystallographica and served on the editorial board of Reports on Progress in Physics. He has served on the Scientific Advisory Committee of the Molecular Foundry and the Advanced Light Source at the Lawrence Berkeley Laboratory and the DOE's BESAC committee. He has been awarded the Burton Medal and the Distinguished Scientist Award of the Microscopy Society of America, and the Buerger Medal of the American Crystallographic Association.

Reviews for High-Resolution Electron Microscopy

... essential reading for anyone interested in HREM and its applications in materials characterization. The fourth edition provides much needed updates on aberration correction and the latest developments in electron detection technology and analytical microscopic techniques. Jian-Min Zuo, Microscopy & Microanalysis