Semiconductor Material and Device Characterization

Dieter K. Schroder (Arizona State University)

$371.95

Hardback

Not in-store but you can order this
How long will it take?

Availability Information

We source books from suppliers in Australia and overseas. For books we don't currently have in stock, the time it takes to get them from our suppliers can vary widely - from a few days to a few months - so we check each book with each supplier to determine the expected time it will take to be supplied to us.

We then advise you accordingly. If the time taken to get any book is too long for you, you can let us know and we will cancel or adjust your order, and refund as required.

To find out the anticipated arrival time for specific items prior to ordering, please contact us by phone or email:

Phone +61 2 9264 3111, or 1800 4 BOOKS (1800 4 26657) if outside Sydney:
option 1 Abbey's Bookshop (Crime, History, Science, Kids & more) • info@abbeys.com.au
option 2 Language Book Centre (ESL & Foreign Languages) • language@abbeys.com.au
option 3 Galaxy Bookshop (Sci-fi, Fantasy, Romance, Graphic Novels) • sf@galaxybooks.com.au

QTY:

English

Wiley-IEEE Press
11 January 2006

Semi-conductors & super-conductors

Series: IEEE Press

This Third Edition updates a landmark text with the latest findings

The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques.

Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including:

Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material

In addition, readers will find fully updated and revised sections in each chapter.

Plus, two new chapters have been added:

Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge.

Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials.

An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

By: Dieter K. Schroder (Arizona State University)
Imprint: Wiley-IEEE Press
Country of Publication: United States
Edition: 3rd edition
Dimensions: Height: 239mm, Width: 163mm, Spine: 51mm
Weight: 1.247kg
ISBN: 9780471739067
ISBN 10: 0471739065
Series: IEEE Press
Pages: 800
Publication Date: 11 January 2006
Audience: Professional and scholarly , Undergraduate
Format: Hardback
Publisher's Status: Active

DIETER K. SCHRODER, PhD, is Professor, Department of Electrical Engineering, Arizona State University. He is a recipient of the ASU College of Engineering Teaching Excellence Award and several other teaching awards. In addition to Semiconductor Material and Device Characterization, Dr. Schroder is the author of Advanced MOS Devices.

Reviews for Semiconductor Material and Device Characterization

The book is well-illustrated and provides an ample bibliography. (Optics & Photonics News, 4 November 2015) I strongly recommend this book for those who want to learn device characterization. (IEEE Circuits & Devices Magazine, November/December 2006)

LATEST DISCOUNTS & SALES: PROMOTIONS

Semiconductor Material and Device Characterization

Dieter K. Schroder (Arizona State University)

$371.95

Hardback

Reviews for Semiconductor Material and Device Characterization

See Also

Contact Abbeys

Contact Galaxy

Contact Language

Contact Us

About ABBEY'S