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Reliability Verification, Testing, and Analysis in Engineering Design

Gary Wasserman Lynn Faulkner (Battelle, Columbus, Ohio, USA)

$588

Hardback

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English
CRC Press Inc
27 November 2002
Expounds on current theory and methods for designing reliability tests and analyzing resultant data through

various examples. Includes and explains simple plots for examining differences between life data sets and estimating acceleration factors.

By:  
Series edited by:  
Imprint:   CRC Press Inc
Country of Publication:   United States
Volume:   v. 153
Dimensions:   Height: 229mm,  Width: 152mm,  Spine: 24mm
Weight:   725g
ISBN:   9780824704759
ISBN 10:   0824704754
Pages:   412
Publication Date:  
Audience:   Professional and scholarly ,  Professional and scholarly ,  Professional & Vocational ,  Undergraduate ,  Further / Higher Education
Format:   Hardback
Publisher's Status:   Active

Gary S. Wasserman is an Associate Professor in the Department of Industrial and Manufacturing Engineering, Wayne State University, Detroit, Michigan. The author or coauthor of several journal articles, book chapters and books, he is a Fellow of the American Society for Quality and Chair of its Reliability Division. He received the B.S. degree (1973) in biomedical engineering from Rensselaer Polytechnic Institute, Troy, New York, the M.S. degree (1975) in chemical engineering from the Massachusetts Institute of Technology, Cambridge, the M.S. degree (1982) in operations research and statistics from the University of Miami, Florida, and the M.S. (1984) and Ph.D. (1986) degrees in information and computer science and industrial and systems engineering, respectively, from the Georgia Institute of Technology. Atlanta.

Reviews for Reliability Verification, Testing, and Analysis in Engineering Design

[The author] has succeeded in producing a relevant, informative tome of moderate length well worth consideration by as reference for practitioners and as either a primary or supplementary text for instructors. Useful tools are ably and adeptly incorporated into the text. - Technometrics, Nov. 2004, Vol. 46, No. 4 a much needed up-to-date presentationattractive to educatorsa significant contribution in this area, and I recommend it... -Quality Progress


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