Pattern Analysis and Machine Intelligence: First International Conference, ICPAMI 2024, Shanghai, China,...

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Jie Yang Yuanjie Zheng

Pattern Analysis and Machine Intelligence

First International Conference, ICPAMI 2024, Shanghai, China, August 30 – September 1, 2024,...

Jie Yang, Yuanjie Zheng, Chen Gong

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English

Springer Nature Switzerland AG
27 March 2025

Electronics engineering; Machine learning; Pattern recognition; Computer vision; Image processing

Series: Communications in Computer and Information Science

Summary
Details

This book constitutes the referred proceedings of the First International Conference on Pattern Analysis and Machine Intelligence, ICPAMI 2024, held in Shanghai, China, from August 30 to September 01, 2024.

The 28 papers presented here were carefully reviewed and selected from 56 submissions. These papers have been organized under the following topical sections: Computer Vision and Pattern Recognition; Natural Language Processing (NLP) and Machine Learning; Intelligent System and Optimization Algorithm.

Edited by: Jie Yang, Yuanjie Zheng, Chen Gong
Imprint: Springer Nature Switzerland AG
Country of Publication: Switzerland
Volume: 2323
Dimensions: Height: 235mm, Width: 155mm,
ISBN: 9789819633487
ISBN 10: 9819633486
Series: Communications in Computer and Information Science
Pages: 238
Publication Date: 27 March 2025
Audience: Professional and scholarly , Undergraduate
Format: Paperback
Publisher's Status: Active