Atomic Force Microscopy in Adhesion Studies

J. Drelich, Kash L. Mittal

$630

Hardback

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English

VSP International Science Publishers
01 October 2005

Microscopy

Since its discovery, Atomic Force Microscopy (AFM) has become a technique of choice for non-destructive surface characterization with sub-molecular resolution.

The AFM has also emerged as a problem-solving tool in applications relevant to particle-solid and particle-liquid interactions, design, fabrication, and characterization of new materials, and development of new technologies for processing and modification of materials.

This volume is a comprehensive review of AFM techniques and their application in adhesion studies. It is intended for both researchers and students in engineering disciplines, physics and biology. Over 100 authors contributed to this book, summarizing current status of research on measurements of colloidal particle-solid adhesion and molecular forces, solid surface imaging and mapping, and discussing the contact mechanics models applicable to particle-substrate and particle-particle systems.

Edited by: J. Drelich, Kash L. Mittal
Imprint: VSP International Science Publishers
Dimensions: Height: 234mm, Width: 156mm,
Weight: 1.680kg
ISBN: 9789067644341
ISBN 10: 906764434X
Pages: 822
Publication Date: 01 October 2005
Audience: College/higher education , Professional and scholarly , Further / Higher Education , Undergraduate
Format: Hardback
Publisher's Status: Active

J. Drelich, Kash L. Mittal

Reviews for Atomic Force Microscopy in Adhesion Studies

'The coverage of this book is comprehensive and provides an excellent resource for researchers in adhesion studies.' Adhesives & Sealants Newsletter, 2006. 'This volume offers a comprehensive review of AFM techniques and their application in adhesion...a reference for AFM techniques for both researchers and students in engineering disciplines, physics and biology.' Rapra Abstracts, 2006.

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Atomic Force Microscopy in Adhesion Studies

J. Drelich, Kash L. Mittal

$630

Hardback

Reviews for Atomic Force Microscopy in Adhesion Studies

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