X-Ray Fluorescence Spectrometry and Related Techniques

Name: X-Ray Fluorescence Spectrometry and Related Techniques
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ISBN: 9781606503911

An Introduction

Eva Margui, Rene Van Grieken

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Hardback

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English

Momentum Press
25 January 2013

Testing of materials; Applied optics

X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF. Those recent technological advances, including the design of low-power micro- focus tubes and novel X-ray optics and detectors, have made it possible to extend XRF to the analysis of low-Z elements and to obtain 2D or 3D information on a micrometer-scale. And, the recent development and commercialization of bench top and portable instrumentation, offering extreme simplicity of operation in a low-cost design, have extended the applications of XRF to many more analytical problems.

By: Eva Margui, Rene Van Grieken
Imprint: Momentum Press
Country of Publication: United States
Dimensions: Height: 254mm, Width: 178mm, Spine: 17mm
Weight: 490g
ISBN: 9781606503911
ISBN 10: 160650391X
Pages: 160
Publication Date: 25 January 2013
Audience: Professional and scholarly , Undergraduate
Format: Hardback
Publisher's Status: Active

Eva Marguí is an Associate Professor in the Department of Chemistry of the University of Girona. She is a researcher in the Analytical and Environmental Chemistry Unit of the same University. Her research interests are focussed on the development of analytical methodologies based on XRF for the determination of elements in environmental and industrial samples. She is the author of more than thirty publications on XRF in high-level journals and has participated in different conferences in the field as an invited lecturer. She is the secretary of the European X-ray Spectrometry Association. René Van Grieken is a Professor in the Department of Chemistry of the University of Antwerp in Belgium, where he teaches instrumental analysis and environmental chemistry and is the Director of the Environmental Analysis Group within the Micro- and Trace Analysis Center. He is active with major European scientific organizations and has delivered 270 invited lectures at international scientific conferences. He has authored or co-authored over 700 publications with leading scientific journals, book publishers, and institutes in 51 countries. These publications have been cited over 11,000 times.